Article14317

Title of the article

A SEMANTIC ANALYSIS OF PERSPECTIVE MICRO- AND NANOELECTRONICS IN TERMS OF KEY INDICATORS’ INCREASE IN QUALITY AND WORKABILITY  

Authors

Adamov Aleksandr Petrovich, doctor of technical sciences, professor, sub-department of microelectronics, Dagestan State Technical University (367006, 49 Piramidal'naya street, Mahachkala, Dagestan, Russia), info@iu4.bmstu.ru
Adamova Arina Aleksandrovna, candidate of technical sciences, associate professor, sub-department of design and production technology of electronic equipment, Bauman Moscow State Technical University (105005, page 1, apartment 5, 2-ya Baumanskaya street, Moscow, Russia), arina.adamova@rambler.ru

Index UDK

658.52

DOI

10.21685/2307-4205-2017-3-14

Abstract

His article is devoted to perspective direction of use in the semantic analysis of advanced products for micro-and nanoelectronics. Attention is paid to indicators of quality and technology . To assess the reliability of the system, choice of quality indicators to describethe connection of the system and meta-system used system analysis and system approach. Problem compact visual representation of multivariate information is one  of the major in modern design procedures. Consider the methods and approaches of visual analysis of complex systems and processes examples of promising targets and processes for micro – and nanoelectronics.

Key words

indicators of quality, technology, nanoelectronics, semantic analysis, the reliability of the system

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Дата создания: 20.11.2017 10:51
Дата обновления: 21.11.2017 16:11